The electron microscopy service is equipped with 2 scanning electron microscopes (SEM) and 3 transmission electron microscopes (TEM):
These electron microscopes enable the imaging of nanoscale samples and the detailed examination of their chemical composition (EDX, WDX, EELS) as well as their crystalline structure (SAED). Additionally, the microscopes allow measurements at various temperatures ranging from -180°C to +1000°C and can perform tomographic imaging using a special sample holder, which is particularly valuable for studying porous films or three-dimensional structures. Cross-sections, known as "cross sections," can also be easily obtained. In particular, a Focused Ion Beam (FIB) can be used to cut samples, producing lamellae with a thickness of approximately 100 nm, which can then be examined in the TEM.
For coating samples with a thin carbon film or a thin metal layer, a sputter coater is available. Samples embedded in resin for (HR)TEM preparation can be processed using our (cryo-)ultramicrotome. Occasionally, a lathe is used to preform the sample for (cryo-)ultramicrotomy.