Moritz Wehrmeister
Photo: M. Wehrmeister
PhD student
RG Mews
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Key aspects of activity
- Direct observation of charge carrier separation
- Scanning probe microscopy of metal-semiconductor hybrid systems
- Combination of electrical, optical and surface potential measurements
Research Topic
Moritz Wehrmeister is investigating the surface potential properties of semiconductor nanoparticles by using atomic force microscopy and Kelvin probe force microscopy. A special focus lies on the potential change and charge carrier movement induced by excitation. The excitation can either be optical, electrical or both. The studied particles specifically include semiconductor-metal hybrid structures such as contacted nanowires, nanosheets or nanorods.
Current or Upcoming Projects
Observing charge separation in CuS nanosheets with gold nanoparticles under illumination.
Investigating the charge transport properties of electrically contacted CdS nanowires under illumination. (together with Daniel Lengle and Nicklas Giese)
Measuring the build-in potential of dotrods with metal tips.