12.2.2 Grain boundary tracer impurity diffusion in pure materials

This chapter provides data for grain boundary tracer impurity diffusion in pure materials like Ag, Al, Al₂O₃, Au, Cd, Co, Cr, Cu, CuInSe₂, Er₂O₃, Fe, H₂O, InSb, KCl, KI, MgO, Mo, NaCl, Nb, Ni, NiO, Pb, Pt, Si, Sn, Ta, TaSi₂, ThO₂, UC_0.95, V, W, Y, and Zr. The values of pre-exponential factor, activation enthalpy and temperature for grain boundary impuritiy diffusion are tabulated for pure materials. In addition, the table shows various methods of determination including sectioning combined with residual-activity, serial sectioning, electron probe microanalysis, Auger electron spectroscopy, electrical resistivity measurement, Rutherford backscattering spectroscopy, autoradiography and secondary-ion mass spectrometry. Additional information on purity of the above materials is given.